Items where Author is "Medlin, Rostislav"
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Siddheswaran, R. and Medlin, Rostislav and Calta, Pavel and Jeyanthi, C. Esther (2022) TEM Cross-Section Sample (XTEM) Preparation of nc-Si/a-SiO2 Multi-Layer Thin Film Using cryo Ar+ Ion Slicing for Microstructural Analyses. In: Research Aspects in Chemical and Materials Sciences Vol. 2. B P International, pp. 25-36. ISBN 978-93-5547-738-5